Atomic Force Microscope

Temperature-dependent growth mode of W-doped ZnO nanostructures

Multidisciplinary / Crystal structure / Pulsed Laser Deposition / Laser Ablation / Temperature Dependence / Atomic Force Microscope / Zno Thin Film / X Ray Diffraction Analysis / Atomic Force Microscope / Zno Thin Film / X Ray Diffraction Analysis

Temperature-dependent growth mode of W-doped ZnO nanostructures

Multidisciplinary / Crystal structure / Pulsed Laser Deposition / Laser Ablation / Temperature Dependence / Atomic Force Microscope / Zno Thin Film / X Ray Diffraction Analysis / Atomic Force Microscope / Zno Thin Film / X Ray Diffraction Analysis

Guided self-assembly of nanostructured titanium oxide

Small Angle X Ray Scattering / Self Assembly / Nanotechnology / Multidisciplinary / Surface Roughness / Nanowires / Wide Angle X-Ray Scattering / Dielectric Properties / Thermal Analysis / Scanning Electron Microscope / Titanium oxide / Atomic Force Microscope / Transmission Electron Microscope / Electric Field / Ethylene Glycol / Cetyl Trimethyl Ammonium Bromide / Nanowires / Wide Angle X-Ray Scattering / Dielectric Properties / Thermal Analysis / Scanning Electron Microscope / Titanium oxide / Atomic Force Microscope / Transmission Electron Microscope / Electric Field / Ethylene Glycol / Cetyl Trimethyl Ammonium Bromide

Silicon Nanostructures Patterned on SOI by AFM Lithography

Silicon on Insulator / Single Electron Transistor / Coulomb blockade / Atomic Force Microscope

Optical properties of individual nanostructures of molecular J-aggregates

Luminescence / Optical Properties / Reflectance Spectroscopy / Optical physics / Atomic Force Microscope

Laser plasma x-ray contact microscopy of living specimens

Engineering / Applied Physics / Scanning Electron Microscopy / Physical sciences / Atomic Force Microscope

Laser plasma x-ray contact microscopy of living specimens [3571-69]

Engineering / Applied Physics / Scanning Electron Microscopy / Physical sciences / Atomic Force Microscope

Chaos control in AFM systems using nonlinear delayed feedback via sliding mode control

Applied Mathematics / AFM / Chaos Control / Feedback Control / Sliding mode control / First-Order Logic / System Simulation / High performance / Numerical Analysis and Computational Mathematics / Atomic Force Microscope / Sliding Mode / Parameter Uncertainty / First-Order Logic / System Simulation / High performance / Numerical Analysis and Computational Mathematics / Atomic Force Microscope / Sliding Mode / Parameter Uncertainty

Chaos control in AFM systems using nonlinear delayed feedback via sliding mode control

Applied Mathematics / AFM / Chaos Control / Feedback Control / Sliding mode control / First-Order Logic / System Simulation / High performance / First Order Logic / Numerical Analysis and Computational Mathematics / Atomic Force Microscope / Sliding Mode / Parameter Uncertainty / First-Order Logic / System Simulation / High performance / First Order Logic / Numerical Analysis and Computational Mathematics / Atomic Force Microscope / Sliding Mode / Parameter Uncertainty

Carbon nanotubes as nanoscale mass conveyors

Scanning Probe Microscopy / Carbon Nanotube / Multidisciplinary / Nature / Electromigration / Meteorites / Mass Transport / Delivery System / Atomic Force Microscope / Aspect Ratio / Meteorites / Mass Transport / Delivery System / Atomic Force Microscope / Aspect Ratio

Chaos control in AFM systems using nonlinear delayed feedback via sliding mode control

Applied Mathematics / AFM / Chaos Control / Feedback Control / Sliding mode control / First-Order Logic / System Simulation / High performance / First Order Logic / Numerical Analysis and Computational Mathematics / Atomic Force Microscope / Sliding Mode / Parameter Uncertainty / First-Order Logic / System Simulation / High performance / First Order Logic / Numerical Analysis and Computational Mathematics / Atomic Force Microscope / Sliding Mode / Parameter Uncertainty

Atomic force microscopy lithography as a nanodevice development technique*

Electron Beam Lithography / Science and Technology / Nanotechnology / Atomic Force Microscopy / Multidisciplinary / Sample Preparation / Surface Roughness / Single Electron Transistor / Microstructures / Atomic Force Microscope / Sample Preparation / Surface Roughness / Single Electron Transistor / Microstructures / Atomic Force Microscope

<title>Transition from precise to accurate critical dimension metrology</title>

Technology transfer / Scanning Electron Microscopy / Data Collection / Repeated Measures / Atomic Force Microscope / Front end / Texas Instruments / National Institute of Standards and Technology / Measurement Uncertainty / Measurement System / Front end / Texas Instruments / National Institute of Standards and Technology / Measurement Uncertainty / Measurement System

Carbon nanotubes as nanoscale mass conveyors

Scanning Probe Microscopy / Carbon Nanotube / Multidisciplinary / Nature / Electromigration / Meteorites / Mass Transport / Delivery System / Atomic Force Microscope / Aspect Ratio / Meteorites / Mass Transport / Delivery System / Atomic Force Microscope / Aspect Ratio

Temperature-dependent growth mode of W-doped ZnO nanostructures

Multidisciplinary / Crystal structure / Pulsed Laser Deposition / Laser Ablation / Temperature Dependence / Atomic Force Microscope / Zno Thin Film / X Ray Diffraction Analysis / Atomic Force Microscope / Zno Thin Film / X Ray Diffraction Analysis

Atomic force microscopy lithography as a nanodevice development technique*

Electron Beam Lithography / Science and Technology / Nanotechnology / Atomic Force Microscopy / Multidisciplinary / Sample Preparation / Surface Roughness / Single Electron Transistor / Microstructures / Atomic Force Microscope / Sample Preparation / Surface Roughness / Single Electron Transistor / Microstructures / Atomic Force Microscope

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